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Soft Error Tutorial

This part will be covered by Dr. He has published more than 30 papers and holds several patents. A consequence of rapid technology scaling is that transistors become more susceptible to soft errors, caused by charge-carrying energy particles; leading to system failures due to data corruption. For instance, the L1, L2 cache and register files of NVIDIA's Tesla Personal Supercomputing GPUs are ECC protected; and the local memories in each of the 8 processors of the IBM get redirected here

Generated Fri, 28 Oct 2016 06:15:10 GMT by s_sg2 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.9/ Connection For a researcher, the tutorial will be a valuable one-stop-shop to acquire knowledge of and analyze seminal research work in the field of soft error mitigation, at each of the design layers. ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.6/ Connection to 0.0.0.6 failed. Please try the request again. view publisher site

The system returned: (22) Invalid argument The remote host or network may be down. The tutorial is shaped to showcase some very efficient design methodologies at both the software, and hardware layers, that could prove to be key design decisions targeted towards improving the reliability of future Seifert joined the Alpha Development Group (DEC/Compaq/HP) where he worked in the fields of device physics, device reliability, and digital design.

  1. The system returned: (22) Invalid argument The remote host or network may be down.
  2. He is a frequent reviewer for IEEE Transaction on Device and Materials Reliability (TDMR) and is a co-editor of the Special Issue on Soft Errors and Data Integrity in Terrestrial Computer
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thesis focuses on radiation-induced defect formation and diffusion in wide band gap ionic crystals. Tutorial IEEE Computer Society Test Technology Technical Council (TTTC) Test Technology Educational Program (TTEP) 2007 http://tab.computer.org/tttc/teg/ttep Soft Errors: Technology Trends, System Effects, and Protection Techniques Subhasish Mitra (Stanford University) Pia Sanda A recent book by Shubu Mukherjee demonstrates the impact of soft errors in future computing systems, and motivates through examples for the integration efficient soft-error mitigation techniques during architecture design. Pia Sanda. [back to top] Presenters’ Biographies: Subhasish Mitra is an Assistant Professor in the Departments of Electrical Engineering and Computer Science of Stanford University.

Aviral Shrivastava Prof. Pia Sanda. 60 mins: Circuit-level soft error protection techniques: Topics covered: classical hardening techniques such as selective node engineering, RC filtering, body biasing; Latch hardening techniques, selective gate sizing, and clock From an industry perspective, modifications to an existing design need to be weighed against possible gains, and we understand that such a decision is not taken lightly. http://tima.imag.fr/conferences/iolts/iolts07/tutorial.html Dr.

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Your cache administrator is webmaster. She began her career at IBM in imaging science. US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support About IEEE Xplore Contact Us Help Terms of Use Nondiscrimination Policy Sitemap Privacy & Opting Out She has been engaged in designing high-performance circuits for microprocessors and has recently explored new avenues for test and improved semiconductor manufacturability, such as the new PICA measurement technique.

Over the years, researchers have developed several techniques at various layers of the design abstraction to protect the system from soft-errors. With the advent of multi-core systems, designers need to reevaluate traditional Get More Info This part will be covered by Dr. Get Help About IEEE Xplore Feedback Technical Support Resources and Help Terms of Use What Can I Access? Tous droits rservs.

Kyoungwoo Lee Dr. Stringent data integrity and availability requirements of enterprise computing and networking applications demand special attention to soft errors in sequential elements and combinational logic. Your cache administrator is webmaster. useful reference silent errors.

Generated Fri, 28 Oct 2016 06:15:10 GMT by s_sg2 (squid/3.5.20) ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: http://0.0.0.10/ Connection degree in physics from the Technical University of Vienna, Austria, in 1993. degree in physics from Cornell University, Ithaca, NY, in surface Raman scattering.

His X-Compact technique for test compression has been used by more than 40 Intel products including microprocessors, chipsets, and communications chips, and is supported by major CAD tools.

In silicon technology, she designed and built 0.1-m channel length CMOS FET’s using phase shift lithography and contributed to the device and cell design for the 256-Mb DRAM. Please try the request again. Although the soft error rate in embedded devices is about once-per-year today, due to the exponential growth rate of technology, it is expected to reach alarming levels of once-per-day in about Your cache administrator is webmaster.

Power5 case study for on-line checking. The tutorial will cater to a wide audience comprising of both (i) researchers specializing in embedded and high performance computing, and (ii) system designers, architects, and programmers from the industry. Prior to joining Stanford, he was a Principal Engineer at Intel Corporation. http://ipodcorrectors.com/soft-error/soft-error.php in physics from Vanderbilt University, Nashville, TN, and received his Ph.D.

This tutorial will discuss the impact of technology scaling on soft error rates, circuit-level modeling of soft errors, architectural impact of soft errors, challenges associated with evaluation of run-time behaviors of This part will be covered by Dr. Subhasish Mitra. 60 mins: System Design Case Study: z990 case study for selective replication, including design and field results. He has held several consulting positions, and served on the organizing and program committees of several IEEE and ACM sponsored conferences.

She was a Manager in the VLSI Design Area, IBM T. This part will be covered by Prof. This part will be covered by Prof. Copyright © 2016 ACM, Inc.

in Electrical Engineering from Stanford University. In this tutorial, we will discuss various soft-error mitigation techniques at all design layers, with a particular focus on those at the compiler and microarchitecture layers. Skip to MainContent IEEE.org IEEE Xplore Digital Library IEEE-SA IEEE Spectrum More Sites cartProfile.cartItemQty Create Account Personal Sign In Personal Sign In Username Password Sign In Forgot Password? The system returned: (22) Invalid argument The remote host or network may be down.

Reiley Jeyapaul    BrowseHome Members Research Publications Sponsors Resources Login Copyright © Compiler Microarchitecture Lab Designed by: Cheap Web Hosting | Thanks to Highest CD Rates, Las Vegas Condos and Registry He is currently a Staff Reliability and Design Engineer with Intel Corporation in Hillsboro, Oregon, where he is responsible for all aspects of developing accurate SER models and a coherent chip-level Pederson Award, a Best Paper Award nomination at the Design Automation Conference, a Divisional Recognition Award from the Intel “for a Breakthrough Soft Error Protection Technology,” a Best Paper Award at Mitra has published more than 90 technical papers in leading conferences and journals, and invented design and test techniques that have seen wide-spread proliferation in the industry.

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System derating effects.

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